This two-day workshop is aimed at beginner and intermediate users of scanning electron microscopes (SEM) who wish to advance their knowledge of sample preparation and imaging. We will cover electron beam-matter interactions, the types of signals generated and the information each proa prees. We will look at different sample preparation strategies, paying particular attention to sample mounting and coating practices. The workshop has a strong hands-on bias, and the theory behind key operational conditions (e.g. kV, signal optimisation and working distance) will be demonstrated on a JEOL IT200 tungsten source SEM. Participants will be left with greater understanding of how to optimise SEM conditions to get the most out any sample.

Date: 30th Nov – 1st Dec 2024

Cost: R2,500 per person

Spaces are limited! For additional information and to register, please contact James Wesley-Smith at jameswesleysmith@icloud.com / 084 477 7175